U. Kaiser U, D.A. Muller, A. Chuvilin, G. Pasold and W. Witthuhn:
The Formation of Clusters and Nanocrystals in Er-Implanted Hexagonal Silicon Carbide
Microscopy and Microanalysis 10(2) (2004), 1-10
electronic version 1100kb PDF-File

J. Scherbel, M. Mans, H. Schneidewind, U. Kaiser, J. Biskupek, F. Schmidl and P. Seidel:
Texture and electrical dynamics of micro- and sub-micrometer bridges in misaligned Tl2Ba2CaCu2O8 films
Phys. Rev. B 70(6) (2004) 104507
electronic version 1120kb PDF-File

J. Biskupek & U. Kaiser:
Practical considerations on the determination of the accuracy of lattice parameters from digital recorded diffractograms
Journ. of Electron. Microsc. 53(6) (2004), 601-610
electronic version 880kb PDF-File

A. Chuvilin, Th. Kups, U. Kaiser:
The effect of the signal-to-noise-ratio in CBED patterns on the accuracy of lattice parameter determination
J. Electron Microscopy 53 (3) (2004), 237-244
electronic version 800kb PDF-File

T. Gorelik, U. Kaiser, Th. Kuhlmann, S. Yulin, W. Richter:
Fcc Sc in Cr/Sc multilayers for soft X-ray mirrors
Applied Surface Science 230 (2004), 1-7

T. Kups & U. Kaiser:
On the site occupancy of dopants in 4H-SiC
Proceedings of the 13th European Microscopy Congress (Eds.: D. Schryvers and J-P. Timmermans), Belgian Society for Microscopy, Liège, Vol. II
electronic version 290kb PDF-File

J. Biskupek, T. Gemming, G. Pasold, W. Witthun & U. Kaiser:
Characterization of metallic nanocyrstals in SiC formed after samarium and cobalt ion implantation
Proceedings of the 13th European Microscopy Congress (Eds.: D. Schryvers and J-P. Timmermans), Belgian Society for Microscopy, Liège, Vol. II
electronic version 640kb PDF-File

A. Chuvilin & U. Kaiser:
CBED of strained materials
Proceedings of the 13th European Microscopy Congress (Eds.: D. Schryvers and J-P. Timmermans), Belgian Society for Microscopy, Liège, Vol. II
electronic version 470kb PDF-File

L. Fedina, A. Chuvilin & A. Gutakovskii:
On the mechanism of {113} defect formation in Si: a study by in situ HREM irradiation
Proceedings of the 13th European Microscopy Congress (Eds.: D. Schryvers and J-P. Timmermans), Belgian Society for Microscopy, Liège, Vol. II
electronic version 200kb PDF-File