Praktikum Elektronische Labormeßtechnik - ENGB 5004

Description:

Students will get a practical view of special aspects of laboratory characterization techniques, with an application emphasis on the characterization of semiconductor devices.

The experiments treat the DC characterization of semiconductor devices using source measure-units and GPIB control, noise parameter measurements, scattering parameter characterization, equivalent-time sampling oscillography, and time-domain reflectometry.

 

 

Verantwortlich

Dr.-Ing. Andreas Trasser

Wann & Wo

Start, Raum, Termine :     nach Absprache

Umfang / Credits

SWS:               4

Credit Points:  5

Sprache

Deutsch oder Englisch