Dr.-Ing. Sebastian Krieter

Sebastian Krieter is a postdoctoral researcher at the SoftVarE working group at the SP institute. He (co)authored more than 40 peer-reviewed publications and is part of the development team of the open-source project FeatureIDE.

Research interests:

  • Variability modeling and analysis
  • Configuration management
  • Software product line testing

 

Materials

  Dateiname Info Geändert
thesis_topics_23-07-19.pdf thesis_topics_23-07-19.pdf 1 MB 19.07.2023 09:40
thesis_topics_23-02-01.pdf thesis_topics_23-02-01.pdf 1 MB 01.02.2023 15:09
thesis_topics_22-06-29.pdf thesis_topics_22-06-29.pdf 1 MB 04.07.2022 16:19

Publications

2024

61.
Greiner, Sandra; Schmid, Klaus; Berger, Thorsten; Krieter, Sebastian; Meixner, Kristof
Generative AI and Software Variability - A Research Vision
Proc. Int'l Working Conf. on Variability Modelling of Software-Intensive Systems (VaMoS) (To Appear)
Herausgeber: ACM, New York, NY, USA
Februar 2024
60.
Böhm, Sabrina; Krieter, Sebastian; Heß, Tobias; Thüm, Thomas; Lochau, Malte
Incremental Identification of T-Wise Feature Interactions
Proc. Int'l Working Conf. on Variability Modelling of Software-Intensive Systems (VaMoS), Seite 27-36
Herausgeber: ACM, New York, NY, USA
Februar 2024
DOI:10.1145/3634713.3634715
ISBN:9798400708770
Datei:pdfhttps://github.com/SoftVarE-Group/Papers/raw/main/2024/2024-VaMoS-Boehm.pdf
59.
Heß, Tobias; Schmidt, Tim Jannik; Ostheimer, Lukas; Krieter, Sebastian; Thüm, Thomas
UnWise: High T-Wise Coverage From Uniform Sampling
Proc. Int'l Working Conf. on Variability Modelling of Software-Intensive Systems (VaMoS) (To Appear)
Herausgeber: ACM, New York, NY, USA
Februar 2024
Datei:pdfhttps://github.com/SoftVarE-Group/Papers/raw/main/2024/2024-VaMoS-Hess.pdf
58.
Kuiter, Elias; Heß, Tobias; Sundermann, Chico; Krieter, Sebastian; Thüm, Thomas; Saake, Gunter
How Easy Is SAT-Based Analysis of a Feature Model?
Proc. Int'l Working Conf. on Variability Modelling of Software-Intensive Systems (VaMoS), Seite 149-151
Herausgeber: ACM, New York, NY, USA
Februar 2024
DOI:10.1145/3634713.3634733
Datei:pdfhttps://github.com/SoftVarE-Group/Papers/raw/main/2024/2024-VaMoS-Kuiter.pdf

2023

57.
Heß, Tobias; Schmidt, Tim Jannik; Ostheimer, Lukas; Krieter, Sebastian; Thüm, Thomas
Evaluation Artifact for UnWise: High T-Wise Coverage from Uniform Sampling
Dezember 2023
DOI:10.5281/zenodo.10303558
Datei:https://doi.org/10.5281/zenodo.10303558
56.
Sundermann, Chico; Kuiter, Elias; Heß, Tobias; Raab, Heiko; Krieter, Sebastian; Thüm, Thomas
On the Benefits of Knowledge Compilation for Feature-Model Analyses
Annals of Mathematics and Artificial Intelligence (AMAI) (To Appear)
Oktober 2023
Herausgeber: Springer
Datei:pdfhttps://github.com/SoftVarE-Group/Papers/raw/main/2023/2023-AMAI-Sundermann.pdf
55.
Krieter, Sebastian; Feichtinger, Kevin; Galindo, Jose A.; Benavides, David; Rabiser, Rick; Sundermann, Chico; Thüm, Thomas
Second Tutorial on the Universal Variability Language
Proc. Int'l Systems and Software Product Line Conf. (SPLC), Seite 273
Herausgeber: ACM, New York, NY, USA
September 2023
DOI:10.1145/3579027.3609002
ISBN:9798400700910
Datei:pdfhttps://github.com/SoftVarE-Group/Papers/raw/main/2023/2023-SPLC-Krieter.pdf
54.
Bittner, Paul Maximilian; Schultheiß, Alexander; Greiner, Sandra; Moosherr, Benjamin; Krieter, Sebastian; Tinnes, Christof; Kehrer, Timo; Thüm, Thomas
Views on Edits to Variational Software
Proc. Int'l Systems and Software Product Line Conf. (SPLC), Seite 141-152
Herausgeber: ACM, New York, NY, USA
August 2023
DOI:10.1145/3579027.3608985
ISBN:9798400700910
Datei:pdfhttps://github.com/SoftVarE-Group/Papers/raw/main/2023/2023-SPLC-Bittner.pdf
53.
Pett, Tobias; Heß, Tobias; Krieter, Sebastian; Thüm, Thomas; Schaefer, Ina
Continuous T-Wise Coverage
Proc. Int'l Systems and Software Product Line Conf. (SPLC), Seite 87-98
Herausgeber: ACM, New York, NY, USA
August 2023
DOI:10.1145/3579027.3608980
ISBN:9798400700910
Datei:pdfhttps://github.com/SoftVarE-Group/Papers/raw/main/2023/2023-SPLC-Pett.pdf
52.
Krieter, Sebastian; Krüger, Jacob; Leich, Thomas; Saake, Gunter
VariantInc: Automatically Pruning and Integrating Versioned Software Variants
Proc. Int'l Systems and Software Product Line Conf. (SPLC), Seite 129-140
Herausgeber: ACM, New York, NY, USA
August 2023
DOI:10.1145/3579027.3608984
ISBN:9798400700910
Datei:pdfhttps://github.com/SoftVarE-Group/Papers/raw/main/2023/2023-SPLC-Krieter.pdf
51.
Kuiter, Elias; Krieter, Sebastian; Sundermann, Chico; Thüm, Thomas; Saake, Gunter
Tseitin or Not Tseitin? The Impact of CNF Transformations on Feature-Model Analyses - Summary
Proc. Software Engineering (SE), Seite 83-84
Herausgeber: Gesellschaft für Informatik, Bonn, Germany
Februar 2023
Datei:pdfhttps://github.com/SoftVarE-Group/Papers/raw/main/2023/2023-SE-Kuiter-Tseitin.pdf
50.
Kuiter, Elias; Krieter, Sebastian; Krüger, Jacob; Saake, Gunter; Leich, Thomas
variED: An Editor for Collaborative, Real-Time Feature Modeling - Summary
Proc. Software Engineering (SE), Seite 85-86
Herausgeber: Gesellschaft für Informatik, Bonn, Germany
Februar 2023
Datei:pdfhttps://github.com/SoftVarE-Group/Papers/raw/main/2023/2023-SE-Kuiter-variED.pdf

2022

49.
Hentze, Marc; Pett, Tobias; Sundermann, Chico; Krieter, Sebastian; Thüm, Thomas; Schaefer, Ina
Generic Solution-Space Sampling for Multi-Domain Product Lines
Proc. Int'l Conf. on Generative Programming: Concepts and Experiences (GPCE)
Herausgeber: ACM, New York, NY, USA
Dezember 2022
DOI:10.1145/3564719.3568695
Datei:pdfhttps://github.com/SoftVarE-Group/Papers/raw/main/2022/2022-GPCE-Hentze.pdf
48.
Kuiter, Elias; Krieter, Sebastian; Sundermann, Chico; Thüm, Thomas; Saake, Gunter
Tseitin or not Tseitin? The Impact of CNF Transformations on Feature-Model Analyses
Proc. Int'l Conf. on Automated Software Engineering (ASE), Seite 110:1-110:13
Herausgeber: ACM, New York, NY, USA
Oktober 2022
DOI:10.1145/3551349.3556938
ISBN:9781450394758
Datei:pdfhttps://github.com/SoftVarE-Group/Papers/raw/main/2022/2022-ASE-Kuiter.pdf
47.
Linsbauer, Lukas; Westphal, Paul; Bittner, Paul Maximilian; Krieter, Sebastian; Thüm, Thomas; Schaefer, Ina
Derivation of Subset Product Lines in FeatureIDE
Proc. Int'l Systems and Software Product Line Conf. (SPLC), Seite 38-41
Herausgeber: ACM, New York, NY, USA
September 2022
DOI:10.1145/3503229.3547033
ISBN:9781450392068
Datei:pdfhttps://github.com/SoftVarE-Group/Papers/raw/main/2022/2022-SPLC-Linsbauer.pdf
46.
Sundermann, Chico; Feichtinger, Kevin; Galindo, Jose A.; Benavides, David; Rabiser, Rick; Krieter, Sebastian; Thüm, Thomas
Tutorial on the Universal Variability Language
Proc. Int'l Systems and Software Product Line Conf. (SPLC), Seite 260:1
Herausgeber: ACM, New York, NY, USA
September 2022
DOI:10.1145/3546932.3547024
ISBN:9781450394437
Datei:pdfhttps://github.com/SoftVarE-Group/Papers/raw/main/2022/2022-SPLC-Sundermann.pdf
45.
Krieter, Sebastian
Efficient Interactive and Automated Product-Line Configuration
University of Magdeburg, Germany
Juni 2022
DOI:10.25673/92625
Datei:https://opendata.uni-halle.de//handle/1981185920/94577
44.
Krieter, Sebastian; Thüm, Thomas; Schulze, Sandro; Ruland, Sebastian; Lochau, Malte; Saake, Gunter; Leich, Thomas
T-Wise Presence Condition Coverage and Sampling for Configurable Systems
Technical Report arXiv:2205.15180
Mai 2022
DOI:10.48550/arXiv.2205.15180
Datei:pdfhttps://github.com/SoftVarE-Group/Papers/raw/main/2022/2022-TR-Krieter.pdf

2021

43.
Pett, Tobias; Krieter, Sebastian; Thüm, Thomas; Lochau, Malte; Schaefer, Ina
AutoSMP: An Evaluation Platform for Sampling Algorithms
Proc. Int'l Systems and Software Product Line Conf. (SPLC), Seite 41-44
Herausgeber: ACM, New York, NY, USA
September 2021
DOI:10.1145/3461002.3473073
ISBN:9781450384704
Datei:pdfhttps://github.com/SoftVarE-Group/Papers/raw/main/2021/2021-SPLC-Pett.pdf
42.
Krieter, Sebastian; Arens, Rahel; Nieke, Michael; Sundermann, Chico; Heß, Tobias; Thüm, Thomas; Seidl, Christoph
Incremental Construction of Modal Implication Graphs for Evolving Feature Models
Proc. Int'l Systems and Software Product Line Conf. (SPLC), Seite 64-74
Herausgeber: ACM, New York, NY, USA
September 2021
DOI:10.1145/3461001.3471148
ISBN:9781450384698
Datei:pdfhttps://github.com/SoftVarE-Group/Papers/raw/main/2021/2021-SPLC-Krieter.pdf
41.
Sundermann, Chico; Heß, Tobias; Engelhardt, Dominik; Arens, Rahel; Herschel, Johannes; Jedelhauser, Kevin; Jutz, Benedikt; Krieter, Sebastian; Schaefer, Ina
Integration of UVL in FeatureIDE
Proc. Int'l Workshop on Languages for Modelling Variability (MODEVAR), Seite 73-79
Herausgeber: ACM, New York, NY, USA
September 2021
DOI:10.1145/3461002.3473940
ISBN:9781450384704
Datei:pdfhttps://github.com/SoftVarE-Group/Papers/raw/main/2021/2021-MODEVAR-Sundermann.pdf
40.
Kuiter, Elias; Krieter, Sebastian; Krüger, Jacob; Saake, Gunter; Leich, Thomas
variED: An Editor for Collaborative, Real-Time Feature Modeling
Empirical Software Engineering (EMSE) :24
März 2021
Herausgeber: Springer
DOI:10.1007/s10664-020-09892-x
39.
Pett, Tobias; Krieter, Sebastian; Runge, Tobias; Thüm, Thomas; Lochau, Malte; Schaefer, Ina
Stability of Product-Line Sampling in Continuous Integration
Proc. Int'l Working Conf. on Variability Modelling of Software-Intensive Systems (VaMoS)
Herausgeber: ACM, New York, NY, USA
Februar 2021
DOI:10.1145/3442391.3442410
ISBN:9781450388245
Datei:pdfhttps://github.com/SoftVarE-Group/Papers/raw/main/2021/2021-VaMoS-Pett.pdf

2020

38.
Knüppel, Alexander; Krüger, Stefan; Thüm, Thomas; Bubel, Richard; Krieter, Sebastian; Bodden, Eric; Schaefer, Ina
Using Abstract Contracts for Verifying Evolving Features and Their Interactions
Seite 122-148
Herausgeber: Springer, Cham, Switzerland
Dezember 2020
122-148
DOI:10.1007/978-3-030-64354-6_5
ISBN:978-3-030-64354-6
Datei:pdfhttps://github.com/SoftVarE-Group/Papers/raw/main/2020/2020-Knueppel.pdf
37.
Ananieva, Sofia; Greiner, Sandra; Kühn, Thomas; Krüger, Jacob; Linsbauer, Lukas; Grüner, Sten; Kehrer, Timo; Klare, Heiko; Koziolek, Anne; Lönn, Henrik; Krieter, Sebastian; Seidl, Christoph; Ramesh, S.; Reussner, Ralf; Westfechtel, Bernhard
A Conceptual Model for Unifying Variability in Space and Time
Proc. Int'l Systems and Software Product Line Conf. (SPLC), Seite 1-12
Herausgeber: ACM, New York, NY, USA
Oktober 2020
DOI:10.1145/3382025.3414955
ISBN:9781450375696