Materials Analysis: Powder X-ray Diffraction
The Core Facility EMMA is equipped with two powder diffractometers (see below), operating in either a reflection (Bragg-Brentano) or transmission (Debye-Scherrer) geometry. Routine analyses focus on determining the phase purity and composition of bulk microcrystalline samples, however, high-quality data for determining crystallographic cell parameters as well as crystal structures can also be collected on our instruments.
As a service we offer Intensity vs. 2θ measurements for a wide variety of sample types on either instrument. Please contact us to discuss your individual needs.
Ausstattung
Reflection Geometry
Malvern Panalytical X'Pert Pro (N25/1212)
Reflection (Bragg-Brentano) Geometry
X-ray Source
- Cu Kβ-filter
Detector
- X'Cellerator
Temperature Range
- room temperature bis 1000 °C
Other Capabilities
- in situ CV Messung
- alle kristallinen Materialien
- Phasenanalyse
- Schichtanalyse
- Textureffekte
Transmission Geometry
Stoe Stadi P (Left Station)
X-ray Source
- Cu Κα1 (C-Tech Ceramik Tube + Monochromator)
Detection
- Mythen2 1K Silicon Strip Detector
Temperature Range
- 80 to 400 K
- Capillary measurements
- Samples with low absorption (thin, radiation-transmissible)
- Small-angle measurements
- Phase analysis
- VT analysis
Stoe Stadi P (Right Station)
X-ray Sources
- Cu Κα1 (C-Tech Keramikrohr + Monochromator)
Detection
- Mythen2 1K Silikon Strip Detektor
Measurement Temperature
- only room temperature
Other Features
- Autosampler: up to 30 samples
- Flatbed measurements
- Samples with low absorption (thin, radiation-transmissible)
- Small-angle measurements
- Phase analysis
- High sample throughput:
- Reaction/synthesis optimization
Contact Person
Samuel Blessing
- +49 731 50-22738
- samuel.blessing(at)uni-ulm.de
Instrument Status
X'Pert Pro: functioning normally
Stadi P: functioning normally
News and Updates
New Service Added:
- Powder-XRD Measurements (Reflection und Transmission) are now available!