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jonathan.ungethuem(at)uni-ulm.de
M.Sc. Jonathan Ungethüm
Jonathan Ungethüm received the B.Sc. and M.Sc. degrees in electrical engineering from the University of Ulm, Germany, in 2016 and 2019, respectively. During his studies he worked with the Institute of Microelectronics, University of Ulm, Germany in the field of bio-medical impedance measurement systems.
He is currently working towards the Ph.D. degree at the Institute of Microelectronics. His research interests include mixed signal CMOS circuit design and data converters.
Studentische Arbeiten
[mt] = Masterarbeit, [rp] = Bachelorarbeit
Aktuelle Arbeiten
Abgeschlossene Arbeiten
- Swikriti Saini
Design of a Single-Channel SAR ADC using a 22nm FDSOI Technology [mt]
Publikationen
2022
6.
Pietzko,
M.;
Ungethüm,
J.;
Kauffman,
J. G.;
Li,
Q.;
Ortmanns,
M.
Bitwise ELD Compensation in ∆Σ Modulators
IEEE International Symposium on Circuits and Systems (ISCAS), Austin, USA
May 2022
Bitwise ELD Compensation in ∆Σ Modulators
IEEE International Symposium on Circuits and Systems (ISCAS), Austin, USA
May 2022
| DOI: | 10.1109/ISCAS48785.2022.9937305 |
2021
5.
Ungethüm,
J.;
Kauffman,
J. G.;
Ortmanns,
M.
Digital Resolution Requirements in 0-X Mash Delta-Sigma-Modulators
2021 IEEE International Conference on Electronics Circuits and Systems (ICECS)
November 2021
Digital Resolution Requirements in 0-X Mash Delta-Sigma-Modulators
2021 IEEE International Conference on Electronics Circuits and Systems (ICECS)
November 2021
4.
Ungethüm,
J.;
Kauffman,
J. G.;
Ortmanns,
M.
Minimizing Signal-Dependent Residue in CT Pipelined ADCs
2021 IEEE International Midwest Symposium on Circuits and Systems (MWSCAS)
August 2021
Minimizing Signal-Dependent Residue in CT Pipelined ADCs
2021 IEEE International Midwest Symposium on Circuits and Systems (MWSCAS)
August 2021
3.
Rajabzadeh,
M.;
Ungethüm,
J.;
Herkle,
A.;
Schilpp,
C.;
Becker,
J.;
Fauler,
M.;
Wittekindt,
O.;
Frick,
M.;
Ortmanns,
M.
A PCB Based 24-Ch. MEA-EIS Allowing Fast Measurement of TEER
IEEE Sensor Journal
March 2021
A PCB Based 24-Ch. MEA-EIS Allowing Fast Measurement of TEER
IEEE Sensor Journal
March 2021
| DOI: | 10.1109/JSEN.2021.3067823 |
2019
2.
Rajabzadeh,
M.;
Ungethüm,
J.;
Herkle,
A.;
Schilpp,
C.;
Fauler,
M.;
Wittekindt,
O.;
Ortmanns,
M.
A 24-Ch. Multi-Electrode Array Allowing Fast EIS to Determine Transepithelial Electrical Resistance
2019 IEEE Biomedical Circuits and Systems Conference (BioCAS), Nara, Japan
October 2019
A 24-Ch. Multi-Electrode Array Allowing Fast EIS to Determine Transepithelial Electrical Resistance
2019 IEEE Biomedical Circuits and Systems Conference (BioCAS), Nara, Japan
October 2019
1.
Rajabzadeh,
M.;
Ungethüm,
J.;
Mandry,
H.;
Schilpp,
C.;
Wittekindt,
O.;
Ortmanns,
M.
An Evaluation Study of Various Excitation Signals for Electrical Impedance Spectroscopy
IEEE International Symposium on Circuits and Systems (ISCAS), Sapporo, Japan
May 2019
An Evaluation Study of Various Excitation Signals for Electrical Impedance Spectroscopy
IEEE International Symposium on Circuits and Systems (ISCAS), Sapporo, Japan
May 2019
Wissenschaftl. Mitarbeiter
