Atomic Force Microscopy (AFM)
The atomic force microscope is not a microscope in the traditional sense as it scans the surface of the sample with a very sharp tip at the end of a cantilever. When the tip is brought in close proximity to the surface, forces between the tip and the sample lead to a deflection of the cantilever. This deflection can be measured by using laser light which is reflected off the back of the cantilever and collected by position-sensitive detectors.
Our AFM is specifically designed for the investigation of biological samples and enables fast measuring in solution. In this way nearly native conditions can be created allowing a precise characterization of the sample.