Application of convergent electron diffraction to determine the thickness of ultrathin samples
Johannes Biskupek and co-authors published a paper about the thickness determination of ultrathin samples using convergent electron diffraction.
Electron Microscopy Group of Materials Science
Contact
Group Leader
Dr. J. Biskupek
Phone: +49 (0)731/50-15315
Room: N27 / 3.005
E-Mail: J. Biskupek
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Gesa Travnitschek
Phone: +49 (0)731/50-22951
Room: N27 / 2.007
E-Mail: G. Travnitschek
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