Focused Ion Beam Center UUlm
The FIB Center UUlm has two high-resolution FEI dual beam microscopes:
Helios Nanolab 600 und Quanta FEG 3D
Both systems are equipped with an electron column and ion column arranged in a 52º angle; both focused beams have a coincident focus point in the eucentric plane. Hence, a maskless modification of specimens (gas-assisted etching, milling, deposition, etc.) with the ion beam can be simultaneously imaged, monitored or analyzed with the electron beam.
Since January 2025 the FIB Center is a part of the Core Facility EMMA of the Ulm University.
Serviceleistungen
Further information about the microscopes and additional available methods like EDX and EBSD can be found on the Homepage of the CF EMMA.
If you are interested in measurements and/or you need a quote please contact us via email:
Image gallery
GIT Labor-Fachzeitschrift (11/2012, S. 787)
Uni Ulm Intern (04/2011)