Institut für Mikroelektronik

M.Sc. Jonathan Ungethüm

Jonathan Ungethüm erhielt 2016 und 2019 die Abschlüsse B.Sc. und M.Sc. in Elektrotechnik von der Universität Ulm, Deutschland. Während seines Studiums arbeitete er am Institut für Mikroelektronik der Universität Ulm im Bereich biomedizinischer Impedanzmesssysteme.

Derzeit arbeitet er an der Promotion. Abschluss am Institut für Mikroelektronik. Zu seinen Forschungsinteressen gehören das CMOS-Schaltungsdesign mit gemischten Signalen und Datenwandler.

Studentische Arbeiten

[mt] = Masterarbeit, [rp] = Bachelorarbeit

Abgeschlossene Arbeiten

  • Fouad Elbadry
    Design and Implementation of a High-Speed Delta-Sigma Modulator for a 0-4 MASH ADC [mt]
  • Luka Stöhr
    Implementation of a Digital Correction Chain for a 0-X MASH ΔΣ-ADC [mt]
  • Swikriti Saini
    Design of a Single-Channel SAR ADC using a 22nm FDSOI Technology [mt]

Publikationen

2024

12.
A. Abdelaal, M. Pietzko, J. Ungethüm, J. G. Kauffman and M. Ortmanns, "Using Negative-R Assisted Integrators in Wide-band Delta-Sigma Modulators", IEEE International Symposium on Circuits and Systems (ISCAS), Singapore, Jul. 2024.
DOI:10.1109/ISCAS58744.2024.10558442
11.
M. Pietzko, J. Ungethüm, A. Abdelaal, J. G. Kauffman and M. Ortmanns, "A 600MS/s 10-bit SAR ADC with unit via-based delta-length C-DAC in 22nm FDSOI", IEEE International Symposium on Circuits and Systems (ISCAS), Singapore, Mai 2024.
DOI:10.1109/ISCAS58744.2024.10558087

2023

10.
J. Ungethüm, M. Pietzko, A. Abdelaal, J. G. Kauffman and M. Ortmanns, "A Chopped 6-bit 1.6 GS/s SAR ADC Utilizing Slow Decision Information in 22 nm FDSOI", ESSCIRC 2023- IEEE 49th European Solid State Circuits Conference (ESSCIRC), Sep. 2023.
DOI:10.1109/ESSCIRC59616.2023.10268704
9.
M. Pietzko, J. Spiess, J. Ungethüm, J. G. Kauffman, Q. Li and M. Ortmanns, "Bitwise ELD Compensation under Integrator Nonidealities in ΔΣ Modulators", 21st IEEE Interregional NEWCAS Conference (NEWCAS), Edinburgh, United Kingdom, Jun. 2023.
DOI:10.1109/NEWCAS57931.2023.10198050
8.
M. Pietzko, J. Ungethüm, J. G. Kauffman and M. Ortmanns, "Delay Error Shaping in ΔΣ Modulators Using Time-Interleaved High Resolution Quantizers", IEEE Transactions on Circuits and Systems I: Regular Papers, Mai 2023.
DOI:10.1109/TCSI.2023.3269573

2022

7.
M. Pietzko, J. Ungethüm, J. G. Kauffman, Q. Li and M. Ortmanns, "Bitwise ELD Compensation in ∆Σ Modulators", IEEE International Symposium on Circuits and Systems (ISCAS), Austin, USA, Mai 2022.
DOI:10.1109/ISCAS48785.2022.9937305
6.
J. Ungethüm, M. Pietzko, J. G. Kauffman, Q. Li and M. Ortmanns, "Maximizing the Inter-Stage Gain in CT 0-X MASH Delta-Sigma-Modulators", IEEE International Symposium on Circuits and Systems (ISCAS), Austin, TX, USA, Mai 2022.
DOI:10.1109/ISCAS48785.2022.9937739

2021

5.
J. Ungethüm, J. G. Kauffman and M. Ortmanns, "Digital Resolution Requirements in 0-X Mash Delta-Sigma-Modulators", 2021 IEEE International Conference on Electronics Circuits and Systems (ICECS), Nov. 2021.
4.
J. Ungethüm, J. G. Kauffman and M. Ortmanns, "Minimizing Signal-Dependent Residue in CT Pipelined ADCs", 2021 IEEE International Midwest Symposium on Circuits and Systems (MWSCAS), Aug. 2021.
3.
M. Rajabzadeh, J. Ungethüm, A. Herkle, C. Schilpp, J. Becker, M. Fauler, O. Wittekindt, M. Frick and M. Ortmanns, "A PCB Based 24-Ch. MEA-EIS Allowing Fast Measurement of TEER", IEEE Sensor Journal, Mä. 2021.
DOI:10.1109/JSEN.2021.3067823

2019

2.
M. Rajabzadeh, J. Ungethüm, A. Herkle, C. Schilpp, M. Fauler, O. Wittekindt and M. Ortmanns, "A 24-Ch. Multi-Electrode Array Allowing Fast EIS to Determine Transepithelial Electrical Resistance", 2019 IEEE Biomedical Circuits and Systems Conference (BioCAS), Nara, Japan, Okt. 2019.
1.
M. Rajabzadeh, J. Ungethüm, H. Mandry, C. Schilpp, O. Wittekindt and M. Ortmanns, "An Evaluation Study of Various Excitation Signals for Electrical Impedance Spectroscopy", IEEE International Symposium on Circuits and Systems (ISCAS), Sapporo, Japan, Mai 2019.

Wissenschaftl. Mitarbeiter

Jonathan Ungethüm