The lecture covered the following aspects of scanning electron microscopy (SEM):

• Basic operating principles of an SEM
• General information on SEM hardware
• Understanding/acquiring SEM images
• Showcasing some SEM applications
• Basic introduction to focused ion beam (FIB) microscopy

Special emphasis was put on:

• electron-specimen interaction
• difference between various electron detectors

• SEM on Wikipedia
• University of Wyoming SEM Page
• World of Scanning Electron Microscopy
• General Microscopy History